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Ion beam profiling from the interaction with a freestanding 2D layer

Authors

I. Shorubalko*

K. Choi

M. Stiefel

H. G. Park*

DOI

https://doi.org/10.3762/bjnano.8.73

Description

8(1), pp. 682–687

Journal

Beilstein Journal of Nanotechnology

PDF

c9a6cb953d40b729570f978af9960e31ffa9.pdf

Year

2017